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GATE Electronics and Communications

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A great practising tool to crack forthcoming GATE Electronics and Communication exam.

Exam mottled Tester Electronics and communication exam has been extensively used by hundreds of students of Engineering   to save time and help their prospective candidates to crack Electronics and communication exam..

Covers all latest syllabus .

As per the latest syllabus.Contains 2000+ questions and answers and solutions.

The software will run on windows Desktop / laptop for 365 days from the date of activation. We will provide the activation key after installation of the software.

VALID FOR A SINGLE PC/LAPTOP.

 

Syllabus

For updated information please visit:

http://www.gate.iitr.ernet.in/?page_id=550

GATE (Graduate Aptitude Test in Engineering) will be conducted by IISc (Indian Institute of Science), Bangalore to provide admission to students in Master of Engineering (M.E) degree programmes. The examination will be jointly administered by the IISc and seven IIT’s namely Mumbai, Delhi, Kanpur, Roorkee, Madras, Kharagpur, Guwahati.

The eligible candidates must apply through the official website. Please check the updated date.  The candidates can check the syllabus of Electronic and Communication Engineering (EC) below:

Syllabus:

Section 1: Engineering Mathematics

Linear Algebra: Matrix algebra, eigen values and eigen vectors, rank, Solution of linear equations – existence and uniqueness.

Added: Vector space, basis, linear dependence and independence

Calculus: Mean value theorems, theorems of integral calculus, evaluation of definite and improper integrals, partial derivatives, maxima and minima, multiple integrals, line, surface and volume  integrals.

Added: Taylor series

Differential Equations: First order equations (linear and nonlinear), higher order linear differential equations, Cauchy’s and Euler’s equations, methods of solution using variation of parameters, partial differential equations, variable separable method, initial and boundary value problems.

Vector Analysis: Curl, Gauss’s, Green’s and Stoke’s theorems

Added: Vectors in plane and space, vector operations, gradient, divergence

Complex Analysis: Analytic functions, Cauchy’s integral theorem, Cauchy’s integral formula; Taylor’s and Laurent’s series, residue theorem.

Removed: Solution integrals

Numerical Methods: Solution of nonlinear equations, single and multi-step methods for differential equations,

Added: Convergence criteria

Probability and Statistics: Mean, median, mode and standard deviation; conditional probability, probability distribution functions – binomial, Poisson, normal; Correlation and regression analysis.

Added: Exponential function, Joint and conditional probability

Section 2: Networks, Signals and Systems

Networks: Network solution methods: nodal and mesh analysis; Network theorems: superposition, Thevenin and Norton’s, maximum power transfer; Wye Delta transformation; Steady state sinusoidal analysis using phasors; Time domain analysis of simple linear circuits; Solution of network equations using Laplace transform; Frequency domain analysis of RLC circuits; Linear 2?port network parameters: driving point and transfer functions; State equations for networks.

Removed: Network graphs

Signals and Systems: Continuous-time signals: Fourier series and Fourier transform representations; Discrete-time signals: discrete-time Fourier transform (DTFT), DFT, FFT, Ztransform,; LTI systems: definition and properties, causality, stability, impulse response, convolution, poles and zeros, parallel and cascade structure, frequency response, group delay, phase delay.

Added: Sampling theorem and applications, interpolation of discrete-time signals, digital filter design
techniques.

Removed: Definitions and properties of Laplace transform

Section 3: Electronic Devices

Electronic Devices: Energy bands in intrinsic and extrinsic silicon; Carrier transport: diffusion current, drift current, mobility and resistivity; Generation and recombination of carriers; P-N junction, Zener diode, BJT, MOS capacitor, MOSFET, LED, photo diode and; Integrated circuit fabrication process: oxidation, diffusion, ion implantation, photolithography  and twin-tub CMOS process

Added: Poisson and continuity equations, solar cell,

Removed: n-tub, p-tub

Section 4: Analog Circuits

Analog Circuits: Small signal equivalent circuits of diodes, BJTs and MOSFETs; Simple diode circuits: clipping, clamping and rectifiers; Single-stage BJT and MOSFET amplifiers: biasing, bias stability, mid-frequency small signal analysis and frequency response; BJT and MOSFET amplifiers: multi-stage, differential, feedback, power and operational; Simple opamp circuits; Active filters; Sinusoidal oscillators: criterion for oscillation, single-transistor and opamp configurations; Function generators, wave-shaping circuits and 555 timers; Power supplies.

Added: Voltage reference circuits ripple removal and regulation.

Removed: Analog CMOS amplifier

Section 5: Digital Circuits

Digital Circuits: Combinatorial circuits: Boolean algebra, minimization of functions using Boolean identities and Karnaugh map, logic gates, arithmetic circuits, code converters, multiplexers, decoders and PLAs; Sequential circuits: latches and flip?flops, counters, shift?registers ; Data converters: sample and hold circuits, ADCs and DACs; Semiconductor memories: ROM, SRAM, DRAM; 8-bit microprocessor (8085): architecture, programming, memory and I/O interfacing.

Added: Number systems, static CMOS implementations, finite state machines

Removed: PROMs and digital IC families (DTL, TTL, ECL, MOS,CMOS)

Section 6: Control Systems

Control Systems: Basic control system components; Feedback principle; Transfer function; Block diagram representation; Signal flow graph; Transient and steady-state analysis of LTI systems; Frequency response; Routh-Hurwitz and Nyquist stability criteria; Bode and rootlocus plots; Lag, lead and lag-lead compensation; State variable model and solution of state equation of LTI systems.

Removed: Elements of Proportional-Integral Derivative (PID)

Section 7: Communication

Communication: Random processes: autocorrelation and power spectral density, properties of white noise, filtering of random signals through LTI systems; Analog communications: amplitude modulation and demodulation, angle modulation and demodulation, spectra of AM and FM, super heterodyne receivers, circuits for analog communications; Information theory: entropy and channel capacity theorem; Digital communications: PCM, DPCM, digital modulation schemes, amplitude, phase and frequency shift keying (ASK, PSK, FSK), matched filter receiver, calculation of bandwidth, SNR and BER for digital modulation; Basics of TDMA, FDMA and CDMA.

Added: Mutual information, QAM, MAP and ML decoding, Fundamentals of error correction, Hamming codes; Timing and frequency synchronization, inter-symbol interference and its mitigation;

Removed: Signal-to-noise ratio (SNR) calculations for AM, FM PM

Section 8: Electromagnetic

Electromagnetic: Maxwell’s equations: differential and integral forms and their interpretation, boundary conditions, wave equation, Poynting vector; Plane waves and properties: reflection and refraction, polarization, phase and group velocity, propagation through various media, skin depth;

Transmission lines: equations, characteristic impedance, impedance matching, impedance transformation, S-parameters, Smith chart; Waveguides: modes, boundary conditions, cut-off frequencies, dispersion relations; Antennas: antenna types, radiation pattern, gain , antenna arrays; Light propagation in optical fibers.
Added: Directivity, return loss, Basics of radar

Removed: Pulse excitation

FEATURES

Software runs on Windows XP/7/8/10 laptop or PC. No internet required!

  • Practice with this Test Software on your PC/Laptop unlimited times.
  • Create your tests for topic/concept/subject
  • Choose how many question you want
  • Choose which kind of questions (incorrectly answered/important marked by you/any random)
  • Choose your timer
  • Stop your timer if any interruption comes your way during practice.
  • Create your answersheets with marks ,time of test  ,solutions and review them
  • Based on your scores, now create tests containing only incorrectly answered questions.